Investigation of optical properties of amorphous Ge 15 Se 85-x Cu x thin films using spectroscopic ellipsometry
Shaaban, ER; Emam-Ismail, M; Abbady, Gh; Prakash, Deo; El-Hagary, M; Afify, N; Verma, KD; Mohamed Emam-Ismail;
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| Title | Investigation of optical properties of amorphous Ge 15 Se 85-x Cu x thin films using spectroscopic ellipsometry | Authors | Shaaban, ER; Emam-Ismail, M; Abbady, Gh; Prakash, Deo; El-Hagary, M; Afify, N; Verma, KD; Mohamed Emam-Ismail | Issue Date | 2016 | Publisher | Elsevier Masson | Journal | Solid State Sciences | Volume | 52 | Start page | 65 | End page | 71 |
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